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Instrumentation & Control Equipments
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Suppliers Directory
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PAPAILIAS INCORPORATED
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245 PEGASUS AVENUE,NORTHVALE,NJ 07647,USA NEW JERSY |
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On-Line Trade Inquiry |
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Products |
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SIGHT FLOW INDICATOR - PAPAILIAS INC, USA, PROFFERS FIS/HP AND FIF/HP SIGHT FLOW INDICATORS FOR IN-LINE, ON-THE-SPOT VIEWING OF A PIPELINE'S CONTENTS. THE UNITS MAY BE CONFIGURED WITH FLAPPER, DRIP TUBE, OR ROTATING FLOW INDICATORS AND ARE RATED AT HP3-300 PSIG (20.7 BAR G) OR HP6-600 PSIG (41.4 BAR G). FULL ANSI PRESSURE CLASS 300 AND 600 RATINGS ARE AVAILABLE. STANDARD MATERIALS OF CONSTRUCTION INCLUDE BRONZE, CARBON STEEL, OR 316 STEEL FOR THE BODY, CARBON STEEL OR DUCTILE IRON FOR THE LENS RETAINER, CARBON STEEL FASTENERS, NEOPRENE OR TEFLON GASKETS, AND BOROSILICATE GLASS LENSES. OTHER MATERIALS ARE AVAILABLE UPON REQUEST. SERIES FIS/HP UNITS ARE PROVIDED WITH NPT THREADED ENDS PER ANSI B2.1. OPTIONS INCLUDE SOCKET WELD AND SILVER BRAZING CONNECTIONS AND DOUBLE WINDOW ASSEMBLIES. SERIES FIF/HP UNITS INCLUDE FLANGED ENDS PER ANSI B 16.5 AND B 16.24. OPTIONS INCLUDE DIN FLANGE CONNECTIONS AND DOUBLE WINDOW ASSEMBLIES.
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STERILE FLOW INDICATOR - THE STERILE FLOW INDICATOR FROM PAPAILIAS INC, USA, CAN BE INSTALLED IN ANY DIRECTION. IDEAL FOR HIGH PURITY APPLICATIONS, IT CAN BE USED TO DETECT EITHER THE PRESENCE OR ABSENCE OF SOLUTIONS, OR TO OBSERVE FLUIDS FOR TURBULENCE, COLOUR, OR CLARITY. IT MEETS FDA AND 3A SPECIFICATIONS, CAN BE STERILIZED, AND IS AUTOCLAVABLE. THE UNIQUE O-RING SEAL DESIGN MINIMIZES BACTERIA TRAPS AND MATERIALS ARE FULLY TRACEABLE. AVAILABLE IN VARIOUS CONFIGURATIONS (CLAMP, WELD, OR FLANGE), THE UNITS ARE STRESS, CRACK, SHATTER, TEMPERATURE AND PRESSURE RESISTANT. CONSTRUCTED OF 316L STAINLESS STEEL OR HASTELLOY, THE STERILE FLOW INDICATOR FEATURES BOROSILICATE OR POLSUFONE INSERT MATERIALS, EPDM, SILICONE, VITON, OR FEP JACKETED GASKET MATERIALS, AND PRODUCT CONTACT SURFACE RA < 20 MICRO INCH, 220 GRIT EP.
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GALAXY SYSTEM MONITORS SIZE & DENSITY OF SILICON PELLETS IN REAL TIME - THE GALAXY PARTICLE ANALYSER SYSTEM FROM PAPAILIAS INC CAN BE USED TO CHARACTERISE SILICON PELLETS USED IN THE SEMICONDUCTOR INDUSTRY IN AN ON-LINE ENVIRONMENT. USING A CHARGE COUPLE DEVICE (CCD) CAMERA AIMED THROUGH A VIEWING DEVICE, THE GALAXY SYSTEM PERFORMS REAL TIME ANALYSIS OF CHANGES IN PARTICLE SIZE AND DENSITY. PARAMETERS CAN BE ESTABLISHED TO MONITOR SUCH THINGS AS THE MOST ABUNDANT PARTICLE SIZE AND A RELAY CAN BE ATTACHED TO ALLOW ACTION TO BE TAKEN BASED ON THE RESULTS OF CHANGES IN THE PARTICLES, EQUIPPED WITH 32 USER SELECTABLE RELAY SET POINTS, AS WELL AS A 4-20 MA OUTPUT SIGNAL, THE SYSTEM ALLOWS USERS TO DEFINE AND ATTACH SET POINTS TO THE RESULTS OF THE ANALYSIS. SET POINTS MAY BE USED TO INDICATE VALUES SUCH AS AVERAGE PARTICLE SIZE, MAXIMUM PARTICLE SIZE OR THE PARTICLE SIZE WITH THE GREATEST DENSITY. THESE SET POINTS CAN BE USED FOR CONTROLLING TYPICAL PROCESSING HARDWARE LIKE ALARMS, MIXERS, VALVES AND OTHER SIMILAR DEVICES.
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