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METAL POWER ANALYTICAL (I) PVT LTD
Address : 8/9 MEHUL PREMISES, KANTI NAGAR ANDHERI (E)
Telephone : 022 28342983, 28348943
Fax : 91 22 28380156
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COLOUR MONITORSCOPE SYSTEM FOR PCB INSPECTION - THE LATEST OFFERING FROM SEIWA OPTICAL CO LTD IS A COLOUR MONITOROSCOPE SYSTEM FOR PCB INSPECTION. IT ADAPTS A CCD COLOUR CAMERA OF 3,80,000 PIXEL ELEMENTS, WITH STEREO ZOOM LENSES AND DUAL FIBRE ILLUMINATION SYSTEM MAKING IT POSSIBLE TO PERFORM STEREOSCOPIC SURFACE OBSERVATION WITH BRIGHT AND DISTINCT COLOUR IMAGES. THE LONG WORKING DISTANCE OBJECTIVE LENS AFFORDS INSPECTION OF PCBS HAVING MOUNTED COMPONENTS. SEIWA HAS CHANGED THE IDEA OF MICROSCOPES FROM LOOK-IN TO WATCH-ON TO IMPROVE THE EFFICIENCY AND REDUCE EYE FATIGUE. THE UNITS ARE OF MODULAR DESIGN AND CAN BE COMBINED ACCORDING TO MAGNIFICATION, ILLUMINATION, MOUNTING AND DIMENSIONS TO SUIT INDIVIDUAL APPLICATIONS.
HYDROGEN ANALYSER - SEVERN SCIENCE INSTRUMENTS LTD, UNITED KINGDOM PRESENTS THE HYSCAN. CONCRETE AMPLIFICATION IN THE QUALITY AND RELIABILITY OF ALUMINIUM ALLOY CASTINGS WILL BE COMPLETED IF THE HYDROGEN CONTENT OF THE MELT IS CONTROLLED. ALUMINIUM ALLOYS ABSORB HYDROGEN IN THE LIQUID STATE AND BARRING THIS, IT IS REMOVED, POROSITY WILL HAPPEN IN THE CASTING. ACCORDINGLY ACCURATE MEASUREMENT OF HYDROGEN IN THE MELT BEFORE CASTING IS FUNDAMENTAL TO ENSURE THAT DEGASSING OPERATIONS ACHIEVE THE SPECIFIED QUALITY ACCEPTANCE VALUE. THIS MEASUREMENT IS PROVIDED ON THE FOUNDRY SHOP FLOOR BY THE HYSCAN HYDROGEN-IN-ALUMINIUM ANALYSER. THE INSTRUMENT IS VIGOROUS, MOBILE AND EASY TO USE AND PROVIDES THE OPERATOR WITH A QUANTITATIVE MEASUREMENT OF HYDROGEN IN THE MELT IN FIVE MINUTES OF SAMPLING. APART FROM ITS USE AS A QUALITY CONTROL TOOL, THE INSTRUMENT CAN BE USED FOR PROCESS INVESTIGATION AND FOR THE EVALUATION OF MELT TREATMENTS. FINANCIAL BENEFITS ALSO ACCUMULATE FROM LOWER SCRAP RATES AND REDUCED ENERGY AND LABOUR COSTS. THESE SAVINGS OFTEN ALLOW THE RETRIEVAL OF THE CAPITAL COST OF THE INSTRUMENT IN LESS THAN A YEAR.
PROCESS TOC ANALYSES - ISCO INC OF USA, THE WORLD LEADERS IN WATER POLLUTION CONTROL, OFFERS AN EXCELLENT ON-LINE TOC ANALYSER FOR UNINTERRUPTED SCREENING OF A VARIETY OF ORGANIC COMPOUNDS IN WATER, WASTEWATER AND EFFLUENTS. TIMELY TOC ANALYSIS IN CASE OF ORGANIC SPILLS AND SAVES EXPENSIVE PROCESSES AND EQUIPMENT OTHER THAN COMPLYING WITH EPA REGULATIONS. THE IMPLICATIONS OF ORGANIC POLLUTION FROM THE CHEMICAL PROCESS INDUSTRIES, WHERE HUNDREDS OF TONS OF ORGANIC TOXIC WASTES ARE RELEASED INTO INDUSTRIAL EFFLUENTS CONTAMINATING SURFACE WATER. BIOLOGICAL OXYGEN DEMAND AND CHEMICAL OXYGEN DEMAND ARE THE METHODS GENERALLY PRACTICED TO MEASURE ORGANIC POLLUTION. THESE METHODS BEING TARDY AND LABOUR INTENSIVE INVOLVING HAZARDOUS CHEMICALS ARE SUPERSEDED BY TOC ANALYSIS-THE MOST DEPENDABLE INDICATOR OF ORGANIC POLLUTION. TOC ANALYSER IS A GREAT HELP IN TERMS OF THAT.
DESKTOP METALS ANALYSER - METALSEAN 20 - ARUN TECHNOLOGY LTD, UK OFFERS THEIR LATEST ATTRACTION- METALSEAN 2000. IT IS A DESKTOP METALS ANALYSER .IT IS DESIGNED TO GIVE HIGH PRECISION ANALYSIS ON-SITE IN THE FOUNDRY AND ENGINEERING INDUSTRIES. IT OFFERS LABORATORY PRECISION ANALYSIS OF FERROUS AND NON-FERROUS METALS IN A SMALL, ROBUST, LOW COST AND EASY TO USE PACKAGE. ITS USE OF THE ADVANCED CCD DETECTOR ARRAY TECHNOLOGY MAKES IT EXTREMELY FLEXIBLE. IT CAN BE SUPPLIED AS A SINGLE BASE OR MULTI-BASE INSTRUMENT USING THE SAME HARDWARE. EXTRA BASES CAN BE ADDED WITHOUT ANY HARDWARE CHANGES, AS ANALYTICAL LINES, OVER 800 OF THEM, ARE ALL AVAILABLE AND SELECTED BY SOFTWARE. IT CAN BE USED AS A PRODUCTION TOOL IN THE FOUNDRY, AS A LOW COST BACK UP TO THE CONVENTIONAL LABORATORY SYSTEM, OR AS A LAB SPECTROMETER. METALSCAN 2000 IS MANUFACTURED BY ARUN TECHNOLOGY LTD, UK. ALSO AVAILABLE IS METALSCAN 1650, A PORTABLE METALS ANALYSER, DESIGNED TO GIVE METAL ANALYSIS ON SITE.
JEWEL MICROSCOPE - THE DISTINCT CHARACTERISTICS OF STEREO MICROSCOPES FROM METAL POWER ANALYTICAL IS THEIR ABILITY TO OBSERVE GEMS/PRECIOUS STONES/ JEWELLERY WITH STEREOSCOPIC VIEW WITHIN A WIDE FIELD. BOTH, CONTINUOUS ZOOM TYPE AND UNIVERSAL TYPES ARE AVAILABLE. UNIQUE FEATURES ARE HIGH RESOLUTION OPTICS; DUAL ILLUMINATION - DARK FIELD AND BRIGHT FIELD AND INCIDENT (NATURAL LIGHT) LIGHT ILLUMINATORS; MAGNIFICATION UP TO 45X NORMAL, (UP TO 90X WITH ADDITIONAL EYEPIECE); GRADEBLE (15°) BASE FOR EASE OF OBSERVATION; CIRCULAR STAGE WITH GEM HOLDER; AND OPTIONAL - SWIVEL BASE AND HANDY GEM HOLDER. USERS ARE ABLE TO OBSERVE WORK PIECES BY USING BOTH EYES THUS REDUCING EYE FATIGUE INCREASING EFFICIENCY. THIS PRODUCT IS FROM SIEWA, JAPAN.
BOMB CALORIMETER - CP 5 - DIGITAL DATA SYSTEMS PVT LTD, SOUTH AFRICA OFFERS WITH AN APT DEMONSTRATION OF HOW WATER JACKET CAN BE REPLACED BY A POLYSTYRENE JACKET, WHICH HAS VERY LITTLE THERMAL MASS AND NEGLIGIBLE HEAT CONDUCTIVITY. IN THE CP 500 BOMB CALORIMETER, THE WATER AND I CONTAINER HAVE BEEN REPLACED BY A HIGH TEMPERATURE CONDUCTIVE COPPER JACKET THAT IS SHRUNK OVER THE SS BODY AT A VERY HIGH PRESSURE AND FORMS A CENTRAL PART OF THE BOMB. THE TEMPERATURE SENSORS ARE EQUALLY SPACED AROUND THE BOMB BODY IN BETWEEN THE COPPER JACKET AND THE SS BODY. THIS METHOD CEASES ALL THE PROBLEMS WITH WATER AND RESULTS IN A VERY FAST BOMB, WITH A FIXED HEAT CAPACITY. SINCE THE BOMB IS THAT MUCH FASTER, THE ENVIRONMENT CAN AFFECT MEASUREMENTS 5 TIMES LESS THAN CONVENTIONALLY. THE BOMB DESIGN IS THE RESULT OF A COMPUTER-AIDED PROCESS AND EXTENSIVE COMPUTER SIMULATIONS TO PREDICT ITS TEMPERATURE BEHAVIOUR. THE BOMB VESSEL IS TESTED AND CERTIFIED AT PRESENT TO 30 MPA AND CONFORMS TO INTERNATIONAL MATERIAL AND TEST STIPULATIONS.
METALLURIGICAL MICROSCOPE - METALLURGICAL MICROSCOPE FROM SIEWA, JAPAN IS THE LATEST ATTRACTION FROM METAL POWER ANALYTICAL. THE FOLLOWING FEATURES CONSTITUTE METALLURGICAL MICROSCOPE. HIGH RESOLUTION OPTICS, HIGH QUALITY, MODERN SQUARE LINE DESIGN, RUGGED LIMB AND LARGE STABLE BASE, LARGE EASY-TO-OPERATE COAXIAL KNOBS FOR FOCUSSING ADJUSTMENT - FINE AND COARSE; SPRING LOADED OBJECTIVES FOR PROTECTION, BALL BEARING REVOLVING NOSE PIECE - QUADRUPLE OR QUINTUPLE; DETACHABLE BASE PLATE WITH BUILT-IN ELECTRONICS FOR EASY SERVICING; HIGH INTENSITY AND READILY AVAILABLE HALOGEN BULBS; WIDE RANGE OF OPTIONAL ACCESSORIES INCLUDING PHOTOCAMERA EQUIPMENT, CCD CAMERA, AND TV MONITOR, STAGE MICROMETER FOR SCALE CALIBRATION, POLARISER LENS, ETC; AND IS READILY ADAPTABLE FOR CONNECTING TO IMAGE ANALYZER.
STEREO MICROSCOPE - SEIWA OPTICAL CO LTD, JAPAN OFFERS THEIR LATEST INNOVATION, STEREO MICROSCOPE. THE SPECIAL CHARACTERISTICS OF THE STEREO MICROSCOPE IS ITS ABILITY TO OBSERVE WORK PIECES IN 3-D WITHIN A WIDE FIELD OF VIEW. USERS ARE ABLE TO NOTICE WORK PIECES BY USING BOTH EYES THUS REDUCING EYE EXHAUSTION AND INCREASING EFFICIENCY. BOTH CONNECTED ZOOM TYPE AND UNIVERSAL TYPE ARE AVAILABLE. UNIQUE CHARACTERISTICS OFFERED INCLUDE HIGH RESOLUTION OPTICS, UNIQUE DUAL ILLUMINATION SYSTEMS (INCIDENT ILLUMINATION AND TRANSMITTED ILLUMINATION), LIGHT SOURCES CAN BE INCIDENT LIGHT, FLUORESCENT ILLUMINATION, FIBRE ILLUMINATION, MAGNIFICATION FROM 1X TO 180X, COMPACT DESIGNS, ETC. OPTION OF CONNECTING CCD CAMERA AND TV MONITOR FURTHER ELIMINATES EYE FATIGUE AND ENABLES CONTINUOUS INSPECTION AND INCREASES OPERATOR AND INSPECTION EFFICIENCY. APPLICATIONS ARE IN ASSEMBLY OF ELECTRONIC PARTS, LCD INSPECTION. AND IC SOLDERING INSPECTION.
STEREO MICROSCOPES FOR GEM & JEWELLERY INDUSTRY - THE LATEST ATTRACTION FROM SEIWA OPTICAL CO LTD, JAPAN IS A CORRECT BRAND STEREO MICROSCOPES FOR THE GEM AND JEWELLERY INDUSTRY. A SPECIAL CHARACTERISTIC OF THIS MICROSCOPE IS ITS ABILITY TO OBSERVE GEMS, PRECIOUS STONES, AND JEWELLERY WITH STEREOSCOPIC VIEW WITHIN A WIDE FIELD. BOTH CONTINUOUS ZOOM TYPE AND UNIVERSAL TYPES ARE AVAILABLE. THEIR FEATURES INCLUDE: HIGH RESOLUTION OPTICS; DUAL ILLUMINATION DARK FIELD AND BRIGHT FIELD AND INCIDENT LIGHT (NATURAL LIGHT) ILLUMINATORS; MAGNIFICATION UP TO 45X NORMAL (UP TO 90X WITH ADDITIONAL EYEPIECE); INCLINABLE (150) BASE FOR EASE OF OBSERVATION; CIRCULAR STAGE WITH GEM HOLDER; AND OPTIONAL SWIVEL BASE AND HANDY GEM HOLDER. USERS CAN OBSERVE WORKPIECES BY USING BOTH EYES THUS REDUCING EYE EXHAUSTION AND INCREASING EFFICIENCY.
CONTACT SCOPE SYSTEM - CS- - A HANDHELD MICROSCOPE IS THE LATEST ATTRACTION FROM SEIWA OPTICAL LTD JAPAN BY NAME CORRECT CONTACT SCOPE CS-99. ALL THAT ONE HAS TO DO IS TO TOUCH THE OBJECT LIKE PC BOARD, WITH THE MICROSCOPE PROBE AND SEE A CLEAR MAGNIFIED 3-D IMAGE ON THE VIDEO MONITOR WITH A DEEP FOCUS DEPTH. THE OPTICAL PERFORMANCE IS PREMIUM AND THE ON-SCREEN IMAGE IS VERY CLEAR. IT CAN ALSO CAPTURE AND RECORD THE IMAGES BY USING THE VIDEO PRINTER AND STORING THEM. THE MAGNIFICATION CAN GO UP TO 1,000 X (14"MONITOR) AND 2,000 X (27"MONITOR).IT’S INDEED AN AMAZING INVENTION.
SUPER SPECTROMETER - ANALYTE-16 - UNITED STATES’ WELL-KNOWN COMPANY LEEMAN LABS INC HAS DEVELOPED A SEQUENTIAL ATOMIC ABSORPTION SPECTROMETER, ANLAYTE 16, WHICH CAN ANALYSE BOTH LIQUIDS AND SOLIDS. THIS PLIABLE INSTRUMENT CAN ANALYSE 24 ELEMENTS IN SOLIDS IN LESS THAN 3 MINUTES AND IN LIQUIDS, IN ONE MINUTE. IT CAN ANALYSE ALL ELEMENTS FROM PPM TO 100% CONCENTRATION LEVELS IN ALL MATRICES WITH UNBELIEVABLE CORRECTNESS, AND IS ABSOLUTELY INDEPENDENT FROM SPECTRAL INTERFERENCE. THUS IT CONGLOMERATES THE CAPABILITIES OF AAS, OES, XRF, ICP AND AUTOMATIC CARBON SULPHUR ANALYSER. COMPARED TO X RAY INSTRUMENTS, ANALYTE 16, WITH ATOM SOURCE FOR SOLIDS, OFFERS EQUAL YIELD AT HIGHER CONCENTRATIONS AND CAN ANALYSE LIGHT ELEMENTS WITH GREATER PRECISION; IT CAN ANALYSE C AND B AT PPM LEVELS, AND ALSO BULK AND DEPTH PROFILES. COMPARED TO ARC/SPARK SPECTROMETERS, IT OFFERS FLEXIBLE ANALYTICAL PROGRAMMER, GIVING BETTER PRECISION ON MAJOR ALLOYING ELEMENTS. THE MULTI MATRIX INSTRUMENT NEEDS FEW CALIBRATION STANDARDS; THE SAME CALIBRATION CURVE IS USED FOR COMMON ELEMENTS REGARDLESS OF MATRIX. FOR LIQUIDS, ANALYTE 16 WITH FLAMESOURCE, WHILE RETAINING ALL THE ADVANTAGES OF AAS, OFFERS VERY HIGH SPEED AND ACCURACY.
DYNAMIC SAMPLING MASS SPECTROMETER - HIDEN ANALYTICAL LTD, UNITED KINGDOM PRESENTS THE DSMS DYNAMIC SAMPLING MASS SPECTROMETER. IT IS A HIGH PERFORMANCE GAS ANALYSIS SYSTEM WITH DIFFERENTIALLY PUMPED QUADRUPLE MASS SPECTROMETER, MOLECULAR BEAM IONISER AND AND CAPILLARY INLET. THE SAMPLING PRESSURE RANGE IS TYPICALLY 10 MBAR TO ATMOSPHERIC PRESSURE. THE DSMS SYSTEM IS OFFERED FOR GAS ANALYSIS APPLICATIONS WHERE SENSITIVITY, STABILITY AND WIDE DYNAMIC RANGE ARE IMPORTANT. THE MOLECULAR CROSS BEAM SAMPLING SYSTEM GIVES A HIGH PRESSURE COLLIMATED MOLECULAR BEAM FOR MAXIMUM SENSITIVITY, YET MAINTAINS MAXIMUM ION SOURCE PUMPING TO MINIMISE THE MEMORY AND CONTAMINANT EFFECTS ASSOCIATED WITH OTHER DESIGNS. ALL NINE DECADES OF DYNAMIC RANGE AVAILABLE FROM THE DUAL HAL SERIES QUADRUPLE ANALYSER ARE ROUTINELY USED. THIS IS ACHIEVED BY DIRECT COUPLING OF THE GAS-SAMPLING INLET TO CROSS BEAM IONISER PROVIDING A COLLIMATED MOLECULAR BEAM FOR ANALYSIS. THE ULTIMATE DETECTION LEVELS FOR SOME COMMON SPECIES ARE HYDROGEN 500 PPB, HELIUM 10 PPB, METHANE 100 PPB, OXYGEN 10 PPB, ARGON 10 PPB, HYDROCARBONS 10 PPB. BENCH TOP/ MOBILE CART/CONSOLE SYSTEM MOUNTING OPTIONS AVAILABLE. HIDEN ANALYTICAL LTD, UNITED KINGDOM PRESENTS THE DSMS DYNAMIC SAMPLING MASS SPECTROMETER. IT IS A HIGH PERFORMANCE GAS ANALYSIS SYSTEM WITH DIFFERENTIALLY PUMPED QUADRUPLE MASS SPECTROMETER, MOLECULAR BEAM IONISER AND AND CAPILLARY INLET. THE SAMPLING PRESSURE RANGE IS TYPICALLY 10 MBAR TO ATMOSPHERIC PRESSURE. THE DSMS SYSTEM IS OFFERED FOR GAS ANALYSIS APPLICATIONS WHERE SENSITIVITY, STABILITY AND WIDE DYNAMIC RANGE ARE IMPORTANT. THE MOLECULAR CROSS BEAM SAMPLING SYSTEM GIVES A HIGH PRESSURE COLLIMATED MOLECULAR BEAM FOR MAXIMUM SENSITIVITY, YET MAINTAINS MAXIMUM ION SOURCE PUMPING TO MINIMISE THE MEMORY AND CONTAMINANT EFFECTS ASSOCIATED WITH OTHER DESIGNS. ALL NINE DECADES OF DYNAMIC RANGE AVAILABLE FROM THE DUAL HAL SERIES QUADRUPLE ANALYSER ARE ROUTINELY USED. THIS IS ACHIEVED BY DIRECT COUPLING OF THE GAS-SAMPLING INLET TO CROSS BEAM IONISER PROVIDING A COLLIMATED MOLECULAR BEAM FOR ANALYSIS. THE ULTIMATE DETECTION LEVELS FOR SOME COMMON SPECIES ARE HYDROGEN 500 PPB, HELIUM 10 PPB, METHANE 100 PPB, OXYGEN 10 PPB, ARGON 10 PPB, HYDROCARBONS 10 PPB. BENCH TOP/ MOBILE CART/CONSOLE SYSTEM MOUNTING OPTIONS AVAILABLE.
 
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