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Instrumentation & Control Equipments
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Suppliers Directory
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METATECH EQUIPMENTS (INDIA) PVT LTD
| | Address : |
595 SHANIWAR PATH, GOWAIKAR BUILDING |
| Telephone : |
24450312 |
| Fax : |
91 20 24450530 |
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On-Line Trade Inquiry |
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Products |
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MICRO VICKERS HARDNESS TESTER - LOW COST MICROHARDNESS TESTER IS THE LATEST ATTRACTION FROM METATECH. ITS A TESTER FOR MEASUREMENT OF LOW LOAD VICKERS HARDNESS. TWO MODELS ARE AVAILABLE, ONE WITH MANUAL READING AND THE OTHER WITH DIGITAL READOUT ASSOCIATED WITH PRINTER FACILITY. THE LOAD SELECTION IS DONE BY GRADUATED DRUM. PRECISION OPTICAL AND INDENTATION ALIGNMENT LEAVES NO CHANCE TO SHIFT THE INDENTATION IMAGE FROM THE CHOSEN FIELD OF VIEW. ONE GETS DISTORTION-FREE INDENTATION AS OF PERFECT INDENTURE AND LOADING MECHANISM. TEST LOADS ARE FROM 10 GF TO 1000 GF. MAGNIFICATION OF OPTICS IS UP TO 40OX. APPLICATION AREAS ARE CHECKING VICKERS/KNOOP HARDNESS OF VERY SMALL/THIN COMPONENTS, INDIVIDUAL MICRO-CONSTITUENTS, SURFACE LAYERS LIKE PLATING/COATING, MEASURING THE CASE DEPTHS OF CASE HARDNESS COMPONENTS, ETC. OPTIONALLY, THE INSTRUMENT IS SUPPLIED WITH FACILITIES LIKE 35 MM SLR PHOTOMICROGRAPHY, DIRECT HARDNESS MEASUREMENT BY IMAGING SYSTEM THROUGH CCD CAMERA, COMPUTER AND VPN MEASUREMENT DEDICATED SOFTWARE AND HOST OF ACCESSORIES REQUIRED FOR CHECKING HARDNESS OF A VARIETY OF CRITICAL COMPONENTS.
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INVERTED METALLURGICAL MICROSCOPE - MIM I - HIGH RESOLUTION INVERTED METALLURGICAL MICROSCOPE UP TO THE DRY MAGNIFICATION OF 60 OX AND 150OX (OIL IMMERSION), WITH ALL IMPORTED OPTICAL COMPONENTS AND OBJECTIVES IS THE LATEST ATTRACTION FROM METATECH. MODEL MIM III OFFERS BOTH BRIGHT AND DARK FIELD ILLUMINATIONS ALONG WITH POLARISER/ANALYSER. THE OPTICAL PARTS ARE COATED WITH ANTI-REFLECTION COATING TO EVADE THE GLARE TO ENHANCE THE CONTRAST AND RESOLUTION. THE OBJECTIVES ARE CORRECTED FOR SPHERICAL BRUISE OFFERING COMPLETELY FLAT FIELD OF PROSPECT EVEN UP TO ITS HIGHEST TOTAL MAGNIFICATION. MICROSCOPE IS AVAILABLE WITH BUILT-IN MECHANISM FOR 35 MM SLR, INSTANT POLAROID PHOTOMICROGRAPHY SYSTEM, CLOSE CIRCUIT VIDEO SYSTEM, AND AN IMAGE ANALYSER. METATECH OFFERS IMPORTED IMAGE ANALYSER FOR THE ANALYSIS OF ASTM GRAIN SIZE PHASE PERCENTAGE, PARTICLE SIZE SHAPE AND ASTM INCLUSION RATINGS.
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METAGRAPH METALLURGICAL MICROSCOPE - METATECH PRESENTS A HIGH RESOLUTION IMPORT SUBSTITUTE INVERTED METALLURGICAL MICROSCOPE, METAGRAPH, UP TO THE DRY MAGNIFICATION OF 1000X OR 1200, WITH IMPORTED OPTICAL COMPONENTS AND HARD COATED OBJECTIVES. THIS MODEL OFFERS BOTH BRIGHT AND DARK FIELD ILLUMINATIONS ALONG WITH SIMPLE POLARISER ATTACHMENT THUS MAKING IT AGREEABLE TO ANY IMPORTED VERSION. THE HIGH RESOLUTION IS CONSUMMATED WITH THE HELP OF PLAN ACHROMATS HAVING HIGH NUMERICAL ORIFICE. THE OPTICAL PARTS ARE COATED WITH ANTI REFLECTION COATING TO ELUDE THE GLARE TO ENHANCE THE CONTRAST AND RESOLUTION. THE OBJECTIVES ARE CORRECTED FOR SPHERICAL ABRASION OFFERING COMPLETELY FLAT FIELD OF VIEW EVEN UP TO ITS HIGHEST TOTAL MAGNIFICATION. METAGRAPH OFFERS MANY FEATURES LIKE: BALL BEARING MOVEMENT FOR FINE FOCUSING ADJUSTMENT; EXTRA LOW COAXIAL X-Y MOVEMENT OF THE SPECIMEN STAGE; BUILT-IN POLARISER; DIRECT AND CORRECTED PHOTOMICROGRAPHY PORT WITH OPTICAL DIVERSION KNOB, ETC. THE MICROSCOPE IS UPDATEABLE FOR 35-MM INSTANT POLAROID PHOTOMICROGRAPHY SYSTEM AND CLOSE CIRCUIT VIDEO SYSTEM, AND ALSO FURTHER WITH IMAGE ARCHIVING AND REPORTING SYSTEM. IT OFFERS IMAGE ANALYSER FOR ANALYSIS OF ASTME-112 GRAIN SIZE, PHASE PERCENTAGE SIZE SHAPE AND ASTME 45 INCLUSION COUNT.
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IMAGE ANALYSIS SYSTEMS - METATECH INDUSTRIES PRESENTS AN ENTIRE RANGE OF IMAGE ANALYSIS SYSTEMS FOR A WIDE VARIETY OF MATERIAL SCIENCE APPLICATIONS WITH MAXIMUM USE OF THE RELEVANT HARDWARE, LIKE MICROSCOPE, COMPUTER, CCD CAMERAS, ETC. THE DEDICATED SOFTWARE PROFFEY PERCENTAGE PHASE ESTIMATION (6 PHASES SIMULTANEOUSLY), GRAIN SIZE ESTIMATION AS PER ASTME-112, NODULARITY THICKNESS, ANALYSIS MEASUREMENT OF COATING, PLATING, DECARBURISATION, INTERLAMILLAR DISTANCE, INTERDENDRITIC ARM SPACING, PARTICLE SIZE, SHAPE, DISTRIBUTION, VICKERS HARDNESS MEASUREMENT, EFFECTIVE CASE DEPTH CURVE AND OTHER DEDICATED PARAMETERS. THE IMAGE ANALYSIS SYSTEMS CAN RENDER NON-METALLIC INCLUSION COUNTING AS PER ASTME-45, DIN-50601, JIS G-555, WHERE SAMPLE PREPARATION IS ABSOLUTE FAVOURABLE TO PERFORM THE SUBJECT ANALYSIS. SOLE COMBINATION OF SOFTWARE BACKUP ALONG WITH METALLOGRAPHY CRITICAL APPLICATIONS EXPERTISE TO CATER TO CRITICAL REQUIRES OF IMAGE APPLICATIONS ARE ALSO OFFERED.
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